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Calibration artifact: 180nm step height, 10µm pitch DESCRIPTION Calibration artifact, 180nm step height, 10µm pitch. This Bruker SurfaceTopography Reference Dies have a variety of step heights and pitches fordaily monitoring of SPM performance. The silicon die with patternedlayer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or traceable to NIST. Replaces model STR10-1800P.
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