Description
DESCRIPTION 145nm AFM Reference Standard, Certified, Non-traceable, Mounted on disk: 145nm Very High Resolution AFM Reference Standard on 12mm steel disk 145nm AFM Reference Standard, Certified, Non-traceable, Unmounted: 145nm Very High Resolution AFM Reference Standard, Unmounted Precision holographic pattern for accurate calibration for high resolution, nanometer scale measurements. Period: 145nm pitch nominal, one dimensional array. Accuracy is +/- 1nm. Calibration certificate will give the actual pitch of the standard. Surface structure: Aluminum lines on glass, 4x6mm dimensions. Line height (about 100nm) and line width (about 75nm) are not calibrated. Usability: The calibrated pattern covers the entire standard. There is sufficient usable area to make tens of thousands of measurements without reusing any areas contaminated or altered by previous scans. AFM: Use in contact, tapping and other modes with image sizes from 250nm to 10um. Available unmounted or mounted on a 12mm steel AFM disk. Certification: Comes with a non-traceable manufacturer’s certificate stating average pitch, based on batch measurements. Sample Certificate for 145nm Pitch Calibration Standard
