Description
DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8″) pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9). Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs Accommodates up to twelve standard 12.7mm (1/2″) pin stubs with 3.2mm (1/8″) pin on numbered positions. Can hold up to four 25.4mm (1″) pin stubs. Material: machined aluminum with stainless steel allen set screws. Holder size is Ø62 x 10.7mm (Ø2.44″ x 0.42″) height w/o pin. Screw used is 6-32 x 1/8 Hex Set, SS Multi Holder for 12 pin stubs
