Description
37N/m, 320kHz, No Reflex Coating, 10-Pack DESCRIPTION
TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for TappingMode™ and other non-contact modes. Unmounted for use on standard AFM’s. Bruker AFM Probes has introduced an improved version of its popular, TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air. The new design provides: Tighter dimensional specifications for improved probe to probe consistency
Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip Improved probe quality and aesthetics This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model TESPA-V2. Tip Geometry:
Standard (Steep) Tip Height:
10 – 15 Front Angle:
25 ± 2.5º Back Angle:
17.5 ± 2.5º Side Angle:
20 ± 2.5º Tip Radius (Nom):
7 Tip Radius (Max):
10 Tip Set Back (Nom):
13.5 Tip Set Back( RNG):
11.5 – 15 Cantilever Material:
0.01 – 0.025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom):
3.3 Cantilever Thickness (RNG):
2.8 – 3.8 Cantilever Geometry:
Rectangular Cantilevers Number:
1
